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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281Profile Analysis in Asymmetric Powder Diffraction...

Profile Analysis in Asymmetric Powder Diffraction with Parallel Beam Geometry and Curved Position Sensitive Detector

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

115-120

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.115

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Online since:

April 1998

Authors:

O. Masson, R. Guinebretière, A. Dauger

Keywords:

Curved Position Sensitive Detector, Line Profile Analysis, Parallel Beam Geometry, Whole-Powder-Pattern Fitting

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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