Simultaneous Analysis of the Small- and Wide-Angle Scattering from Nanometric SiC Based on the ab initio Pattern Simulation

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Periodical:

Materials Science Forum (Volumes 278-281)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

106-109

DOI:

10.4028/www.scientific.net/MSF.278-281.106

Citation:

S. Gierlotka et al., "Simultaneous Analysis of the Small- and Wide-Angle Scattering from Nanometric SiC Based on the ab initio Pattern Simulation", Materials Science Forum, Vols. 278-281, pp. 106-109, 1998

Online since:

April 1998

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$35.00

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