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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281Simultaneous Analysis of the Small- and Wide-Angle...

Simultaneous Analysis of the Small- and Wide-Angle Scattering from Nanometric SiC Based on the ab initio Pattern Simulation

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

106-109

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.106

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Online since:

April 1998

Authors:

Stanislaw Gierlotka, Bogdan F. Palosz, Roman Pielaszek, Svetlana Stelmakh, Stephen Doyle, Thomas Wroblewski

Keywords:

Nanometric Materials, Silicon Carbide (SiC), Small Angle Scattering

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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