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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281Adaptation of the Rietveld Method to the...

Adaptation of the Rietveld Method to the Characterization of the Lamellar Microstructure of Polymers

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

127-132

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.127

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Online since:

April 1998

Authors:

O. Dupont, A. Jonas, R. Legras

Keywords:

Disordered Crystals, Poly (Ether-Ether-Ketone), Rietveld, Wide Angle X-Ray Scattering WAXS

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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