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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281New Possibilities of X-Ray Diffraction Methods in...

New Possibilities of X-Ray Diffraction Methods in Structure Investigations of Multilayer Materials

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

164-169

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.164

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Online since:

April 1998

Authors:

Jan T. Bonarski, Zbigniew Świątek, R. Ciach, Z.T. Kuźnicki, I.M. Fodchuk

Keywords:

Nanolayer Structure, Penetration Depth, Pole Figure of Thin Layers, Solar Cell

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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