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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281Use of Sliding-Window Fourier Transform in the...

Use of Sliding-Window Fourier Transform in the Analysis of X-Ray Reflectivity Data

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

170-176

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.170

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Online since:

April 1998

Authors:

R. Smigiel, A. Knoll, N. Broll, A. Cornet

Keywords:

Fourier Transform, Gabor Representation, Time-Frequency Analysis (TFA), X-Ray Reflectometry

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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