A Computer Program for Structural Refinement from Thin Film XRD Patterns

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Periodical:

Materials Science Forum (Volumes 278-281)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

177-183

DOI:

10.4028/www.scientific.net/MSF.278-281.177

Citation:

M. Leoni and P. Scardi, "A Computer Program for Structural Refinement from Thin Film XRD Patterns", Materials Science Forum, Vols. 278-281, pp. 177-183, 1998

Online since:

April 1998

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$35.00

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