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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281A Computer Program for Structural Refinement from...

A Computer Program for Structural Refinement from Thin Film XRD Patterns

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

177-183

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.177

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Online since:

April 1998

Authors:

Matteo Leoni, Paolo Scardi

Keywords:

Structure Refinement, Thin Film, Whole-Powder-Pattern Fitting

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Сopyright:

© 1998 Trans Tech Publications Ltd. All Rights Reserved

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