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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281Structural Studies of Submicron Grained Copper,...

Structural Studies of Submicron Grained Copper, Germanium and Silicon

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

496-501

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.496

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Online since:

April 1998

Authors:

Radomír Kužel, Rinat K. Islamgaliev, František Chmelík

Keywords:

Copper (Cu), Germanium, Silicon, Submicron Grained Materials, XRD Line Broadening Analysis

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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