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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281X-Ray Diffraction Measurements on c-Axis Oriented...

X-Ray Diffraction Measurements on c-Axis Oriented YBaCuO Thin Films Deposited by Metalorganic Vapour Deposition

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

478-485

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.478

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Online since:

April 1998

Authors:

J. Bassas, X. Alcobé, M. Doudkowsky, J. Santiso, S. Berton, A. Figueras

Keywords:

Ba-Incorporation, MOCVD, Off-Stoichiometric Composition, Thin Film, YBCO

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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