X-Ray Diffraction Measurements on c-Axis Oriented YBaCuO Thin Films Deposited by Metalorganic Vapour Deposition

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Periodical:

Materials Science Forum (Volumes 278-281)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

478-485

DOI:

10.4028/www.scientific.net/MSF.278-281.478

Citation:

J. Bassas et al., "X-Ray Diffraction Measurements on c-Axis Oriented YBaCuO Thin Films Deposited by Metalorganic Vapour Deposition", Materials Science Forum, Vols. 278-281, pp. 478-485, 1998

Online since:

April 1998

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$35.00

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