Time and Temperature Resolved Studies of Crystallisation of Polymers with Rapid X-Ray Diffraction
p.430
p.430
Crystalline and Amorphous States in Alloys Zn-Sb and Cd-Sb under High Pressure
p.434
p.434
High Temperature Grazing Incidence Studies on Aluminium Films
p.442
p.442
High Temperature X-Ray Diffraction Studies of the Phase Formation Process of Iridium Silicide Thin Films
p.448
p.448
Application of the Distorted-Wave Born Approximation to Interface Characterization in W/Si Multilayer Thin Films
p.454
p.454
Microstructural Characterization of Nanocrystalline Thin Films by Grazing Incidence Diffraction: Au and Tb0.3Dy0.7Fe2 (Terfenol-D)
p.460
p.460
Structure of Reactively Sputtered Ta-N-O Films
p.466
p.466
Effects of Oxygen Stoichiometry on the Structural Properties of W-Ti-O Thin Films
p.472
p.472
X-Ray Diffraction Measurements on c-Axis Oriented YBaCuO Thin Films Deposited by Metalorganic Vapour Deposition
p.478
p.478
Application of the Distorted-Wave Born Approximation to Interface Characterization in W/Si Multilayer Thin Films
Abstract:
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Periodical:
Materials Science Forum (Volumes 278-281)
Pages:
454-459
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Online since:
April 1998
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© 1998 Trans Tech Publications Ltd. All Rights Reserved
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