Microstructural Characterization of Nanocrystalline Thin Films by Grazing Incidence Diffraction: Au and Tb0.3Dy0.7Fe2 (Terfenol-D)

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Periodical:

Materials Science Forum (Volumes 278-281)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

460-465

DOI:

10.4028/www.scientific.net/MSF.278-281.460

Citation:

A. Skokan et al., "Microstructural Characterization of Nanocrystalline Thin Films by Grazing Incidence Diffraction: Au and Tb0.3Dy0.7Fe2 (Terfenol-D)", Materials Science Forum, Vols. 278-281, pp. 460-465, 1998

Online since:

April 1998

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