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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281Microstructural Characterization of...

Microstructural Characterization of Nanocrystalline Thin Films by Grazing Incidence Diffraction: Au and Tb_0.3Dy_0.7Fe₂ (Terfenol-D)

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

460-465

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.460

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Online since:

April 1998

Authors:

A. Skokan, P. von Blanckenhagen, E. Quandt, M. Walter

Keywords:

Magnetostriction, Nanomaterial, Particle Size Analysis, Rietveld Refinement, Size-Strain Analysis, Thin Film

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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