Ellipsometric Characterization of Copper Deposits

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Periodical:

Materials Science Forum (Volumes 289-292)

Edited by:

Pier Luigi Bonora and Flavio Deflorian

Pages:

465-470

Citation:

G. Sandmann et al., "Ellipsometric Characterization of Copper Deposits", Materials Science Forum, Vols. 289-292, pp. 465-470, 1998

Online since:

August 1998

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Price:

$38.00

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