Z-Scan Measurements of Transient and Stationary Optical Nonlinearities in Semiconductor-Metal Nanocomposites

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 297-298)

Edited by:

Steponas Asmontas and Adolfas Dargys

Pages:

119-122

DOI:

10.4028/www.scientific.net/MSF.297-298.119

Citation:

R. Adomavičius and A. Krotkus, "Z-Scan Measurements of Transient and Stationary Optical Nonlinearities in Semiconductor-Metal Nanocomposites", Materials Science Forum, Vols. 297-298, pp. 119-122, 1999

Online since:

December 1998

Export:

Price:

$35.00

In order to see related information, you need to Login.