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HomeMaterials Science ForumMaterials Science Forum Vols. 297-298Z-Scan Measurements of Transient and Stationary...

Z-Scan Measurements of Transient and Stationary Optical Nonlinearities in Semiconductor-Metal Nanocomposites

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Ultrafast Phenomena in Semiconductors

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Periodical:

Materials Science Forum (Volumes 297-298)

Pages:

119-122

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.297-298.119

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Online since:

December 1998

Authors:

R. Adomavičius, A. Krotkus

Keywords:

Nonlinear Refraction, Two-Photon Absorption, Z-Scan

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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