Nondestructive Characterisation of MOVPE-Grown CdTe and ZnTe Epilayers by Picosecond and Nanosecond 'Excite-Probe' Techniques

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Periodical:

Materials Science Forum (Volumes 297-298)

Edited by:

Steponas Asmontas and Adolfas Dargys

Pages:

111-114

DOI:

10.4028/www.scientific.net/MSF.297-298.111

Citation:

E. Gaubas et al., "Nondestructive Characterisation of MOVPE-Grown CdTe and ZnTe Epilayers by Picosecond and Nanosecond 'Excite-Probe' Techniques", Materials Science Forum, Vols. 297-298, pp. 111-114, 1999

Online since:

December 1998

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