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HomeMaterials Science ForumMaterials Science Forum Vols. 297-298Nondestructive Characterisation of MOVPE-Grown...

Nondestructive Characterisation of MOVPE-Grown CdTe and ZnTe Epilayers by Picosecond and Nanosecond 'Excite-Probe' Techniques

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Ultrafast Phenomena in Semiconductors

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Periodical:

Materials Science Forum (Volumes 297-298)

Pages:

111-114

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.297-298.111

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Online since:

December 1998

Authors:

Eugenijus Gaubas, V. Mizeikis, L. Bastienė, Kęstutis Jarašiūnas, N. Lovergine, Anna Maria Mancini, P. Prete, L. Subačius

Keywords:

Free Carrier Absorption, II-VI Epilayers, Microwave Generation, Transient Grating

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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