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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324XRD and Optical Characterisation of GaN and...

XRD and Optical Characterisation of GaN and Associated Substrate Materials

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

1056-1061

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.1056

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Online since:

January 2000

Authors:

E.B. Fantner, T. Ryan, M. Schurman, Ian T. Ferguson

Keywords:

Gallium Nitride (GaN), High-Resolution, Photoluminescence (PL), Silicon Carbide (SiC), X-Ray Diffraction (XRD)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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