XRD and Optical Characterisation of GaN and Associated Substrate Materials

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 321-324)

Edited by:

R. Delhez, E.J. Mittemeijer

Pages:

1056-1061

DOI:

10.4028/www.scientific.net/MSF.321-324.1056

Citation:

E.B. Fantner et al., "XRD and Optical Characterisation of GaN and Associated Substrate Materials", Materials Science Forum, Vols. 321-324, pp. 1056-1061, 2000

Online since:

January 2000

Export:

Price:

$35.00

In order to see related information, you need to Login.