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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324X-Ray Diffraction Method of Grain Size Measurement

X-Ray Diffraction Method of Grain Size Measurement

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

133-136

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.133

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Online since:

January 2000

Authors:

Yu.D. Yagodkin, G.V. Vekilova, R.S. Mungalov

Keywords:

Grain Size, Surface Layer, X-Ray Diffraction Method

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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