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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324X-Ray Diffraction Characterization of Textured...

X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

137-143

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.137

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Online since:

January 2000

Authors:

I. Tomov, V. Yamakov

Keywords:

Film, Pole Density, Secondary Extinction, X-Ray Diffraction (XRD)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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