X-Ray Analysis of Nanostructural Materials Made by Reactive Ball Milling: The Effect of Wavelength on Signal to Background Ratio

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Periodical:

Materials Science Forum (Volumes 343-346)

Edited by:

J. Eckert, H. Schlörb and L. Schultz

Pages:

649-656

DOI:

10.4028/www.scientific.net/MSF.343-346.649

Citation:

A. Calka et al., "X-Ray Analysis of Nanostructural Materials Made by Reactive Ball Milling: The Effect of Wavelength on Signal to Background Ratio", Materials Science Forum, Vols. 343-346, pp. 649-656, 2000

Online since:

May 2000

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