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HomeMaterials Science ForumMaterials Science Forum Vols. 343-346Microstructural Characterisation of Amorphous and...

Microstructural Characterisation of Amorphous and Nanocrystalline Structures Through Diffraction Methods

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Metastable, Mechanically Alloyed and Nanocrystalline Materials 1999

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Periodical:

Materials Science Forum (Volumes 343-346)

Pages:

657-664

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.343-346.657

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Online since:

May 2000

Authors:

Luca Lutterotti, R. Campostrini, Stefano Gialanella, R. Di Maggio

Keywords:

Amorphous Structure, Nanocrystalline Material, SiO₂, Titania (TiO₂), X-Ray Diffraction (XRD), Zro₂

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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