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HomeMaterials Science ForumMaterials Science Forum Vols. 347-349Micro-Area Residual Stress Measurement Using a...

Micro-Area Residual Stress Measurement Using a Two-Dimensional Detector

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Periodical:

Materials Science Forum (Volumes 347-349)

Pages:

101-106

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.347-349.101

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Online since:

May 2000

Authors:

Bob B. He, Kingsley L. Smith, Uwe Preckwinkel, Willard schultz

Keywords:

Area Detector, Large Grain, Microdiffraction, Residual Stress, Sample Alignment, Textured Sample, Two-Dimensional X-Ray Diffraction, Virtual Oscillation

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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