Towards Reference Samples for X-Ray Residual Stress Analysis

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 347-349)

Edited by:

A.J. Böttger, R. Delhez and E.J. Mittemeijer

Pages:

12-16

DOI:

10.4028/www.scientific.net/MSF.347-349.12

Citation:

R. Botzon and M. François, "Towards Reference Samples for X-Ray Residual Stress Analysis", Materials Science Forum, Vols. 347-349, pp. 12-16, 2000

Online since:

May 2000

Export:

Price:

$35.00

In order to see related information, you need to Login.