Characterization of the Interface Strain/Stress State in Si-on-Sapphire Heterostructure

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Periodical:

Materials Science Forum (Volumes 347-349)

Edited by:

A.J. Böttger, R. Delhez and E.J. Mittemeijer

Pages:

568-573

DOI:

10.4028/www.scientific.net/MSF.347-349.568

Citation:

D. Mogilyanski et al., "Characterization of the Interface Strain/Stress State in Si-on-Sapphire Heterostructure", Materials Science Forum, Vols. 347-349, pp. 568-573, 2000

Online since:

May 2000

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$35.00

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