Paper Titles

Strain Measurements on Geomaterials by Neutron Time-of-Flight Diffraction
p.542

Prediction of Macro- and Microstresses in Supersaturated Alloy Layers Before and After Precipitation Treatments
p.548

Internal Stresses in Aluminium Interconnects
p.556

X-Ray Diffraction Determination of Residual Stresses in Narrow Copper Interconnects with Submicronic Widths
p.562

Characterization of the Interface Strain/Stress State in Si-on-Sapphire Heterostructure
p.568

Curvature Behaviour of Multilayer Specimens of Thermal Barrier Systems
p.574

Characterisation of Residual Stress and Microstructure in Bioactive Coatings for Titanium Alloy Hip Implants
p.580

Measured Stress Concentration at a Notch Front in Si₃N₄
p.586

Residual Stresses due to Hard-Machining - Industrial Experiences
p.592

HomeMaterials Science ForumMaterials Science Forum Vols. 347-349Characterization of the Interface Strain/Stress...

Characterization of the Interface Strain/Stress State in Si-on-Sapphire Heterostructure

Article Preview

Abstract:

You might also be interested in these eBooks

Residual Stress ECRS 5

Info:

Periodical:

Materials Science Forum (Volumes 347-349)

Pages:

568-573

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.347-349.568

Citation:

Cite this paper

Online since:

May 2000

Authors:

D. Mogilyanski, E. Gartstein, H. Metzger

Keywords:

Al₂O₃ Substrate, Bending, Biaxial Strain Model, Grazing Incidence Diffraction, Laser Interferometry, Si Epilayer, X-Ray High Resolution

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2000 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: