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Line Profile Analysis in the Rietveld Method and Whole-Powder-Pattern Fitting
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Calculation of Diffraction Line Profiles for Structures with Dislocations
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HomeMaterials Science ForumMaterials Science Forum Vols. 378-381Line Profile Analysis in the Rietveld Method and...

Line Profile Analysis in the Rietveld Method and Whole-Powder-Pattern Fitting

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Periodical:

Materials Science Forum (Volumes 378-381)

Pages:

132-141

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.378-381.132

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Online since:

October 2001

Authors:

Paolo Scardi, Yu Hui Dong, Matteo Leoni

Keywords:

Crystallite Size, Dislocation, Faulting, Line Profile Analysis, Line Shape, Whole-Powder-Pattern Fitting, Whole-Powder-Pattern Modelling

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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