Peculiarities of the X-Ray Powder Diffraction Patterns from FCC Crystals Containing a High Concentration of Random Deformation Stacking Faults

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Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

154-159

DOI:

10.4028/www.scientific.net/MSF.378-381.154

Citation:

A.I. Ustinov et al., "Peculiarities of the X-Ray Powder Diffraction Patterns from FCC Crystals Containing a High Concentration of Random Deformation Stacking Faults", Materials Science Forum, Vols. 378-381, pp. 154-159, 2001

Online since:

October 2001

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