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Comparison of Optical Elements for X-Ray Diffraction Analysis in Para-Focusing and Parallel Beam Geometries
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Polycapillary Condensing Lens: Alignment Procedures and Optical Performances
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X-Ray Powder Diffractometer with an Elliptic Focusing Göbel Mirror and Debye Scherrer Geometry
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Experimental Study of the Resolution Function of a Texture Diffractometer
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Improved Backloading for Better Results
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The Commissioning of a High Count Rate Detector on Station 2.3 at the SRS
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In-Situ Studies of X-Ray Diffraction Line Profiles from Strained Copper Foils
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Automated Estimations of Asymmetric Linewidth Parameters for High-Resolution X-Ray & Neutron Powder Diffraction Data
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Magnetic Structure Determination from Powder Diffraction Symmetry Analysis and Simulated Annealing
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HomeMaterials Science ForumMaterials Science Forum Vols. 378-381Improved Backloading for Better Results

Improved Backloading for Better Results

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Periodical:

Materials Science Forum (Volumes 378-381)

Pages:

240-247

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.378-381.240

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Online since:

October 2001

Authors:

Th. Moederl

Keywords:

Preferred Orientation, Rietveld Method, Sample Preparation

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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