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HomeMaterials Science ForumMaterials Science Forum Vols. 378-381In-Situ Studies of X-Ray Diffraction Line Profiles...

In-Situ Studies of X-Ray Diffraction Line Profiles from Strained Copper Foils

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Periodical:

Materials Science Forum (Volumes 378-381)

Pages:

254-261

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.378-381.254

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Online since:

October 2001

Authors:

Robert W. Cheary, C.C. Tang, P.A. Lynch, M.A. Roberts, S.M. Clark

Keywords:

Copper (Cu), Crystallite Size, Dislocation, In Situ Stress Analysis, Line Broadening Analysis, Strain Analysis

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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