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HomeMaterials Science ForumMaterials Science Forum Vols. 378-381Co/Si/W/Si Multilayers with Enhanced Thermal...

Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics

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Periodical:

Materials Science Forum (Volumes 378-381)

Pages:

364-369

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.378-381.364

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Online since:

October 2001

Authors:

Matej Jergel, A. Anopchenko, Š. Luby, E. Majková, R. Senderák, V. Holý

Keywords:

Diffuse Scattering, Interface, Multilayer, UV Optics, X-Ray Optics, X-Ray Reflectivity

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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