Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

364-369

DOI:

10.4028/www.scientific.net/MSF.378-381.364

Citation:

M. Jergel et al., "Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics", Materials Science Forum, Vols. 378-381, pp. 364-369, 2001

Online since:

October 2001

Export:

Price:

$35.00

In order to see related information, you need to Login.