Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis

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Periodical:

Materials Science Forum (Volumes 404-407)

Edited by:

A.M. Dias, J. Pina, A.C. Batista and E. Diogo

Pages:

133-140

DOI:

10.4028/www.scientific.net/MSF.404-407.133

Citation:

H. Bougrab et al., "Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis", Materials Science Forum, Vols. 404-407, pp. 133-140, 2002

Online since:

August 2002

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$35.00

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