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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Dislocation Microstructures Identification by...

Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

133-140

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.133

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Online since:

August 2002

Authors:

Hakim Bougrab, Karim Inal, Marcel Berveiller

Keywords:

Dislocation Configuration, Dislocation Density Tensor, Green's Function, Line Broadening, X-Ray Diffraction (XRD)

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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