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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Stress and Texture Analysis with Two-Dimensional...

Stress and Texture Analysis with Two-Dimensional X-Ray Diffraction

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

109-114

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.109

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Online since:

August 2002

Authors:

Bob B. He, Uwe Preckwinkel, Kingsley L. Smith

Keywords:

2D Detector, Area Detector, Residual Stress, Texture, Two-Dimensional X-Ray Diffraction

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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