Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation
p.293
p.293
The Use of Dispersive Double Crystal Monochromator – A Way for High-Resolution Powder Diffractometry
p.299
p.299
Advantageous Use of Glass Capillaries as Primary Optics for X-Ray Residual Stress Analyses and a Novel Concept for “Micro Diffraction” Stress Analysis
p.303
p.303
Determination of Crystal Lattice Parameters by the Maximum Entropy Technique
p.309
p.309
The Influence of the Macroscopic Surface Topography on Spatially Resolved Residual Stress Measurements
p.317
p.317
Error Minimisation in Stress Measurement by Rational Choice of Measurement Positions
p.323
p.323
Advanced Strain Analysis by High Energy Synchrotron X-Ray Diffraction
p.329
p.329
Synchrotron Evaluation of Residual Stress in Palladium Alloy Substrate
p.335
p.335
High-Energy X-Ray Synchrotron Radiation Analysis of Residual-Stress Distribution of Shot-Peened Steel
p.341
p.341
The Influence of the Macroscopic Surface Topography on Spatially Resolved Residual Stress Measurements
Abstract:
You might also be interested in these eBooks
Info:
Periodical:
Materials Science Forum (Volumes 404-407)
Pages:
317-322
Citation:
Online since:
August 2002
Authors:
Price:
Сopyright:
© 2002 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: