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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Analysis of Depth Profiles of Residual Stress...

Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

293-298

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.293

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Online since:

August 2002

Authors:

Koichi Akita, Kohei Kubota, Yasuo Yoshioka, Hiroshi Suzuki

Keywords:

Residual Stress, Shot Peening, Stress Gradients, Synchrotron Radiation (XRD), X-Ray Stress Measurement

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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