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Evaluation of the Influence of Shot Peening Parameters on Residual Stress Profiles Using Finite Element Simulation
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HomeMaterials Science ForumMaterials Science Forum Vols. 426-432X-Ray Microbeam Strain Measurements in...

X-Ray Microbeam Strain Measurements in Polycrystalline Films

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THERMEC'2003

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Periodical:

Materials Science Forum (Volumes 426-432)

Pages:

3945-3950

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.426-432.3945

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Online since:

August 2003

Authors:

G.S. Cargill III, L. Moyer, W. Yang, B.C. Larson, Gene E. Ice

Keywords:

Electromigration, Mircobeam, Residual Strains, X-Ray

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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