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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Positronium Time-Of-Flight Measurements of Porous...

Positronium Time-Of-Flight Measurements of Porous Silsesquioxane Films

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

361-363

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.361

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Online since:

January 2004

Authors:

Run Sheng Yu, Toshiyuki Ohdaira, Yoshinori Kobayashi, Ryoichi Suzuki, Kenji Ito, Kouichi Hirata, Kimiyasu Sato

Keywords:

Hydrogen-Silsesquioxane, Porous Film, Positronium, Time-of-Flight (TOF)

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[4] K. Ito, Y. Kobayashi, K. Hirata, H. Togashi, R. Suzuki and T. Ohdaira: Rad. Phys. Chem. Vol. 68 (2003), accepted.

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[6] Y. Nagashima, M. Kakimoto, T. Hyodo, K. Fujiwara, A. Ichimura, T. Chang, J. Deng, T. Akakane, T. Chiba, K. Suzuki, B. T. A. Mckee and A. T. Stewart: Phys. Rev. A Vol 52 (1995).

DOI: 10.1103/physreva.52.258

[4] 0 keV. YK48 Time (ns) -50 50 150 250.

5 keV.

[1] 0 keV.

[2] 0 keV.

[3] 0 keV.

[4] 0 keV Counts (arb. units) Time (ns) -50 50 150 250.

5 keV.

[1] 0 keV.

[3] 0 keV.

[2] 0 keV.

[4] 0 keV KI31.