Positronium Time-Of-Flight Measurements of Porous Silsesquioxane Films

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Periodical:

Materials Science Forum (Volumes 445-446)

Edited by:

Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito

Pages:

361-363

Citation:

R. S. Yu et al., "Positronium Time-Of-Flight Measurements of Porous Silsesquioxane Films", Materials Science Forum, Vols. 445-446, pp. 361-363, 2004

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January 2004

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DOI: https://doi.org/10.1103/physrevb.58.12676

[6] Y. Nagashima, M. Kakimoto, T. Hyodo, K. Fujiwara, A. Ichimura, T. Chang, J. Deng, T. Akakane, T. Chiba, K. Suzuki, B. T. A. Mckee and A. T. Stewart: Phys. Rev. A Vol 52 (1995).

[4] 0 keV. YK48 Time (ns) -50 50 150 250.

5 keV.

[1] 0 keV.

[2] 0 keV.

[3] 0 keV.

[4] 0 keV Counts (arb. units) Time (ns) -50 50 150 250.

5 keV.

[1] 0 keV.

[3] 0 keV.

[2] 0 keV.

[4] 0 keV KI31.

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