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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Depth Profiling of Ultra-Thin Polymer Films on...

Depth Profiling of Ultra-Thin Polymer Films on Substrates Studied by Positron Annihilation Spectroscopy

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

367-369

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.367

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Online since:

January 2004

Authors:

J. Zhang, H. Chen, R. Zhang, Ying Li, Ryoichi Suzuki, Toshiyuki Ohdaira, Yan Ching Jean

Keywords:

Depth Profile, Polystyrene, Positron Annihilation, Profilometry, Thin Film

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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