Prediction of the Structural Performances of ZnO Nanowires Grown on GaAs (001) Substrates by Metalorganic Chemical Vapour Deposition (MOCVD)

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Application potential of ZnO nanowires grown by MOCVD for atomic force microscope (AFM) probes was evaluated by predicting numerically their structural performances in terms of flexural stiffnesses and natural frequencies. Estimated properties of the nanowires suggested that they are structurally compatible with typical AFM cantilevers while maintaining mechanical stability during operation and they are therefore promising candidates for high aspect ratio probes.

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Periodical:

Materials Science Forum (Volumes 449-452)

Edited by:

S.-G. Kang and T. Kobayashi

Pages:

1245-1248

Citation:

W. Lee et al., "Prediction of the Structural Performances of ZnO Nanowires Grown on GaAs (001) Substrates by Metalorganic Chemical Vapour Deposition (MOCVD)", Materials Science Forum, Vols. 449-452, pp. 1245-1248, 2004

Online since:

March 2004

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