An EBSD Study on Orientation Effects during Recrystallization of Coarse-Grained Niobium

Hugo Ricardo Zschommler Sandim; Dierk Raabe

doi:10.4028/www.scientific.net/MSF.467-470.519

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HomeMaterials Science ForumMaterials Science Forum Vols. 467-470An EBSD Study on Orientation Effects during...

An EBSD Study on Orientation Effects during Recrystallization of Coarse-Grained Niobium

Abstract:

The recrystallization behavior of coarse-grained niobium depends on the nature of its deformation microstructure. In this regard, a longitudinal section of a high-purity coarse-grained niobium ingot was cold rolled to a thickness reduction of 96% followed by annealing in vacuum at 800°C for 1 h. Metallographic inspection in cold-rolled and annealed specimens was carried out in a field emission gun scanning electron microscope (FEG-SEM). Microtexture was determined by electron-backscattered diffraction (EBSD) coupled to the FEG-SEM. The use this technique has evidenced details of the boundary character and subgrain structure found in partially recrystallized regions. The early stages of primary recrystallization are associated to the presence of high-angle lamellar boundaries found in the cold-worked state. Abnormal subgrain growth has been evidenced as a viable mechanism for nucleation of recrystallization.

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Periodical:

Materials Science Forum (Volumes 467-470)

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519-524

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.467-470.519

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Online since:

October 2004

Authors:

Hugo Ricardo Zschommler Sandim, Dierk Raabe

Keywords:

Subgrains, Electron Backscatter Diffraction (EBSD), Niobium, Orientation Effect, Recovery, Recrystallization

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