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Application of Wavelet Digital Filter of Fourier Transform Profilometry in 3-D Measurement

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Abstract:

Fourier transform profilometry in 3-D measurement based on wavelet digital filter is presented in this paper. Before phase demodulation, original modulated grating image is handled with wavelet transform in order to remove the background components and high frequency. This method resolves spectrum overlapping at some extent and reduces the requirement of low-pass filter.

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Periodical:

Materials Science Forum (Volumes 471-472)

Pages:

654-657

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.471-472.654

Citation:

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Online since:

December 2004

Authors:

Yun Shan Wang, S. Fu, Jin Quan Xu, Can Lin Zhou, S.C. Si, C.Y. Gao

Keywords:

Fourier Transform Profilometry, Spectrum Overlapping, Wavelet Transform (WT)

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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References

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