Application of Wavelet Digital Filter of Fourier Transform Profilometry in 3-D Measurement

Abstract:

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Fourier transform profilometry in 3-D measurement based on wavelet digital filter is presented in this paper. Before phase demodulation, original modulated grating image is handled with wavelet transform in order to remove the background components and high frequency. This method resolves spectrum overlapping at some extent and reduces the requirement of low-pass filter.

Info:

Periodical:

Materials Science Forum (Volumes 471-472)

Edited by:

Xing Ai, Jianfeng Li and Chuanzhen Huang

Pages:

654-657

DOI:

10.4028/www.scientific.net/MSF.471-472.654

Citation:

Y. S. Wang et al., "Application of Wavelet Digital Filter of Fourier Transform Profilometry in 3-D Measurement", Materials Science Forum, Vols. 471-472, pp. 654-657, 2004

Online since:

December 2004

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Price:

$35.00

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