Structural Properties of Sputter-Deposited ZnO Thin Films Depending on the Substrate Materials

Abstract:

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We have demonstrated the growth of ZnO thin films with c-axis orientation at room temperature on various substrates such as Si(100), SiO2, and sapphire by the r.f. magnetron sputtering method. X-ray diffraction (XRD) and scanning electron microscopy altogether indicated that the larger grain size and the higher crystallinity were attained when the ZnO films were deposited on sapphire substrates, compared to the films on Si or SiO2 substrates. The c-axis lattice constant decreased by thermal annealing for the ZnO films deposited on Si or SiO2 substrates, while increased by the thermal annealing for the ZnO films grown on sapphire substrates.

Info:

Periodical:

Materials Science Forum (Volumes 475-479)

Main Theme:

Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

1825-1828

DOI:

10.4028/www.scientific.net/MSF.475-479.1825

Citation:

J. H. Myung et al., "Structural Properties of Sputter-Deposited ZnO Thin Films Depending on the Substrate Materials", Materials Science Forum, Vols. 475-479, pp. 1825-1828, 2005

Online since:

January 2005

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$35.00

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