The Effect of Frequency of Electromagnetic Vibration on the Primary Silicon Size in Hypereutectic Al-Si Alloy

Abstract:

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In this study, the electromagnetic vibration is adopted for control of the size of primary Si phase. The higher the current density and frequency of electromagnetic vibration (EMV), the finer the size of primary Si phase. The higher the current density but the lower frequency of EMV, the bigger the size of primary Si phase. This phenomenon considered to be related the collision, agglomeration and diffusion of silicon atoms.

Info:

Periodical:

Materials Science Forum (Volumes 475-479)

Main Theme:

Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

413-416

DOI:

10.4028/www.scientific.net/MSF.475-479.413

Citation:

E. P. Yoon et al., "The Effect of Frequency of Electromagnetic Vibration on the Primary Silicon Size in Hypereutectic Al-Si Alloy", Materials Science Forum, Vols. 475-479, pp. 413-416, 2005

Online since:

January 2005

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Price:

$35.00

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