Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source
In-situ measurement of local orientation and strain Has Been carried out for a copperpolycrystals under a uniaxial loading using a synchrotron x-ray microdiffraction method at the Advanced Light Source. The heterogeneities of deformation-induced microstructure within single grains were observed. There were differences in the selection of simultaneously acting slip systems among neighboring volume elements within a grain.
Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie
H.D. Joo et al., "Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source", Materials Science Forum, Vols. 475-479, pp. 4149-4152, 2005