Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

Abstract:

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In-situ measurement of local orientation and strain Has Been carried out for a copperpolycrystals under a uniaxial loading using a synchrotron x-ray microdiffraction method at the Advanced Light Source. The heterogeneities of deformation-induced microstructure within single grains were observed. There were differences in the selection of simultaneously acting slip systems among neighboring volume elements within a grain.

Info:

Periodical:

Materials Science Forum (Volumes 475-479)

Main Theme:

Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

4149-4152

DOI:

10.4028/www.scientific.net/MSF.475-479.4149

Citation:

H.D. Joo et al., "Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source", Materials Science Forum, Vols. 475-479, pp. 4149-4152, 2005

Online since:

January 2005

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$35.00

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