Microstructure and Microwave Characterization of SrO2 -Ba2 Ti9 O20 Dielectric Resonators for Telecommunications Applications

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Periodical:

Materials Science Forum (Volumes 498-499)

Edited by:

Lucio Salgado and Francisco Ambrozio Filho

Pages:

324-330

DOI:

10.4028/www.scientific.net/MSF.498-499.324

Citation:

M. do C. de A. Nono et al., "Microstructure and Microwave Characterization of SrO2 -Ba2 Ti9 O20 Dielectric Resonators for Telecommunications Applications", Materials Science Forum, Vols. 498-499, pp. 324-330, 2005

Online since:

November 2005

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$35.00

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