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HomeMaterials Science ForumMaterials Science Forum Vols. 498-499Microstructure and Microwave Characterization of...

Microstructure and Microwave Characterization of SrO₂ -Ba₂ Ti₉ O₂₀ Dielectric Resonators for Telecommunications Applications

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Advanced Powder Technology IV

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Periodical:

Materials Science Forum (Volumes 498-499)

Pages:

324-330

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.498-499.324

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Online since:

November 2005

Authors:

Maria do Carmo de Andrade Nono, S.T. Fonseca, Pedro José Castro, Yu. Koldayeva

Keywords:

Ceramic Characterization, Dielectric Resonators, Microwave Characterization

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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