Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction

Abstract:

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The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation.

Info:

Periodical:

Materials Science Forum (Volumes 524-525)

Edited by:

W. Reimers and S. Quander

Pages:

291-296

DOI:

10.4028/www.scientific.net/MSF.524-525.291

Citation:

P. Frankel et al., "Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction ", Materials Science Forum, Vols. 524-525, pp. 291-296, 2006

Online since:

September 2006

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Price:

$35.00

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