Strains, Stresses and Elastic Properties in Polycrystalline Metallic Thin Films: In Situ Deformation Combined with X-Ray Diffraction and Simulation Experiments

Abstract:

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X-ray diffraction is used in combination with tensile testing for measuring elastic properties of metallic thin films. Size effect, elastic anisotropy and grain morphologies are considered in all these experiments and supported by different kind of numerical simulations operating at different length scales. Such instrumental studies are time consuming even if synchrotron sources are used. New experiments are under progress for reducing acquisition data and improving precision on strain measurements. After introducing briefly the main principles and results of our techniques, first promising measurements on nanometric W/Cu multilayers using 2D CCD detectors and high monochromatic flux at the Advanced Light Source Berkeley (USA) on beam line 11.3.1 are presented. In addition, simulation experiments for analyzing elasticity in textured gold film are discussed.

Info:

Periodical:

Materials Science Forum (Volumes 524-525)

Edited by:

W. Reimers and S. Quander

Pages:

735-740

DOI:

10.4028/www.scientific.net/MSF.524-525.735

Citation:

P. Goudeau et al., "Strains, Stresses and Elastic Properties in Polycrystalline Metallic Thin Films: In Situ Deformation Combined with X-Ray Diffraction and Simulation Experiments", Materials Science Forum, Vols. 524-525, pp. 735-740, 2006

Online since:

September 2006

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$35.00

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