An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy

Article Preview

Abstract:

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 532-533)

Pages:

161-164

Citation:

Online since:

December 2006

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Z. Weng, G.E. Bridges and et al: Proceeding of the 2002 IEEE Canadian Conference on Electrical & Computer Engineering, (2002), pp.378-382

Google Scholar

[2] A. Hou, B. Nechay, et al: Opt. Quantum Electron., Vol.28 (1996), pp.819-841.

Google Scholar

[3] S. Belaidi and et al: J. Appl. Phys., Vol.81 (1997) No.3, pp.1023-1030.

Google Scholar

[4] S. Patil and et al: J. Appl. Phys., Vol.88, (2000), pp.6940-6942.

Google Scholar

[5] S. Patil and et al: Surf. Interface Anal., Vol.33 (2002), pp.155-158.

Google Scholar

[6] S. Watanabe and et al, J. Vac. Sci. Tech., (1993), pp.1774-1781.�

Google Scholar

[7] Y.L Zhi, Y.G. Ben and G.Z. Yang: Phys. Rev., Vol.57 (1998) No.15, pp.9225-9233. [8] Z.Y. Li, B.Y. Gu and G.Z. Yang: Eur. Phys., (1998), pp.123-131.

Google Scholar