An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy

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Periodical:

Materials Science Forum (Volumes 532-533)

Edited by:

Chengyu Jiang, Geng Liu, Dinghua Zhang and Xipeng Xu

Pages:

161-164

DOI:

10.4028/www.scientific.net/MSF.532-533.161

Citation:

H. X. Wang et al., "An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy", Materials Science Forum, Vols. 532-533, pp. 161-164, 2006

Online since:

December 2006

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$35.00

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