An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy

H. X. Wang et al., "An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy", Materials Science Forum, Vols. 532-533, pp. 161-164, 2006

Online since:

December 2006

Authors:

Hong Xi Wang, Jian Zhao, Jian Yuan Jia

Keywords:

Electrostatic Force, Electrostatic Force Microscopy, Microprobe, Tip

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References

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[6] S. Watanabe and et al, J. Vac. Sci. Tech., (1993), pp.1774-1781. �.

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[8] Z.Y. Li, B.Y. Gu and G.Z. Yang: Eur. Phys., (1998), pp.123-131.

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