Comparative Possibilities of Different X-Ray Methods by Study of SPD Metal Materials

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Abstract:

Possibilities of X-ray methods, using diffractometric measurements of X-ray line profiles and crystallographic texture, are compared as applied to study of SPD metal materials. The texture analysis gives the most direct data on the degree of grain fragmentation under conditions of deformation. The consideration is illustrated by results, obtained by X-ray studies of ECAP rods from Cu and Ti.

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Periodical:

Materials Science Forum (Volumes 584-586)

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197-202

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Online since:

June 2008

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© 2008 Trans Tech Publications Ltd. All Rights Reserved

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