3D Tomographic EBSD Measurements of Heavily Deformed Ultra Fine Grained Cu-0.17wt%Zr Obtained from ECAP

Abstract:

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Obtaining knowledge on the grain boundary topology in three dimensions is of great importance as it controls the mechanical properties of polycrystalline materials. In this study, the three dimensional texture and grain topology of as-deformed ultra fine grained Cu-0.17wt%Zr have been investigated using three-dimensional orientation microscopy (3D electron backscattering diffraction, EBSD) measurements in ultra fine grained Cu-0.17wt%Zr. Equal channel angular pressing was used to produce the ultra fine grained structure. The experiments were conducted using a dual-beam system for 3D-EBSD. The approach is realized by a combination of a focused ion beam (FIB) unit for serial sectioning with high-resolution field emission scanning electron microscopy equipped with EBSD. The work demonstrates that the new 3D EBSD-FIB technique provides a new level of microstructure information that cannot be achieved by conventional 2D-EBSD analysis.

Info:

Periodical:

Materials Science Forum (Volumes 584-586)

Edited by:

Yuri Estrin and Hans Jürgen Maier

Pages:

434-439

DOI:

10.4028/www.scientific.net/MSF.584-586.434

Citation:

A. Khorashadizadeh et al., "3D Tomographic EBSD Measurements of Heavily Deformed Ultra Fine Grained Cu-0.17wt%Zr Obtained from ECAP", Materials Science Forum, Vols. 584-586, pp. 434-439, 2008

Online since:

June 2008

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$35.00

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