3D Tomographic EBSD Measurements of Heavily Deformed Ultra Fine Grained Cu-0.17wt%Zr Obtained from ECAP

Anahita Khorashadizadeh; Myrjam Winning; Dierk Raabe

doi:10.4028/www.scientific.net/MSF.584-586.434

Paper Titles

TEM Studies on the Effect of Nature of Precipitates in Al-Li Alloy on Microstructural Evolution during Severe Plastic Deformation
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Strengthening of Nickel Deformed by High Pressure Torsion
p.417

TEM Study of Local Disordering: A Structural Phase Change Induced by High-Pressure Torsion
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Bulk Al Materials from Back Pressure Equal Channel Angular Consolidation of Mechanically Milled Particles
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3D Tomographic EBSD Measurements of Heavily Deformed Ultra Fine Grained Cu-0.17wt%Zr Obtained from ECAP
p.434

Mechanical Properties and Microstructure Development of Ultrafine-Grained Cu Processed by ECAP
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The Evolution of Homogeneity during Processing of Commercial Purity Aluminium by ECAP
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Strength and Plasticity of Ultra-Fine Grained Zirconium at Low Temperatures
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Influence of Severe Thermomechanical Treatment on Formation of Nanocrystalline Structure in Ni 718 and Ni 718Plus Alloys and their Mechanical Properties
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HomeMaterials Science ForumMaterials Science Forum Vols. 584-5863D Tomographic EBSD Measurements of Heavily...

3D Tomographic EBSD Measurements of Heavily Deformed Ultra Fine Grained Cu-0.17wt%Zr Obtained from ECAP

Abstract:

Obtaining knowledge on the grain boundary topology in three dimensions is of great importance as it controls the mechanical properties of polycrystalline materials. In this study, the three dimensional texture and grain topology of as-deformed ultra fine grained Cu-0.17wt%Zr have been investigated using three-dimensional orientation microscopy (3D electron backscattering diffraction, EBSD) measurements in ultra fine grained Cu-0.17wt%Zr. Equal channel angular pressing was used to produce the ultra fine grained structure. The experiments were conducted using a dual-beam system for 3D-EBSD. The approach is realized by a combination of a focused ion beam (FIB) unit for serial sectioning with high-resolution field emission scanning electron microscopy equipped with EBSD. The work demonstrates that the new 3D EBSD-FIB technique provides a new level of microstructure information that cannot be achieved by conventional 2D-EBSD analysis.