Enhancing the Mid-Term Competitiveness of a Semiconductor Manufacturing Factory through Collaborative Yield Learning Planning

Yi Chi Wang; Toly Chen; Kun Tai Li

doi:10.4028/www.scientific.net/MSF.594.475

Paper Titles

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Investigating the Dynamics of Organelle-Actin Assembly with Dielectrophoresis
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Collaborative Environment Development for the Supported CAD/CAM
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Parametric Design and Design Associability in 3D CAD
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Estimating Job Cycle Time in Semiconductor Manufacturing with an ANN Approach Equally Dividing and Post-Classifying Jobs
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Enhancing the Mid-Term Competitiveness of a Semiconductor Manufacturing Factory through Collaborative Yield Learning Planning
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Agent-Based Integrated and Collaborative Engineering Asset Management
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Robust Estimation Design of a Class of Systems with Noise Coupling Input Saturation
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The 3D Printer Design and Model Formation by a Commercial Inkjet Printing Module
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HomeMaterials Science ForumMaterials Science Forum Vol. 594Enhancing the Mid-Term Competitiveness of a...

Enhancing the Mid-Term Competitiveness of a Semiconductor Manufacturing Factory through Collaborative Yield Learning Planning

Abstract:

Product yield is undoubtedly the most critical factor to the competitiveness of a semiconductor manufacturing factory. Therefore, evaluating the competitiveness of a semiconductor manufacturing factory based on the yields of all its products is a reasonable idea. For this purpose, a systematic procedure is established to evaluate the mid-term competitiveness of a semiconductor manufacturing factory in which the yield learning processes of all its products are considered simultaneously. After that, for products that are not competitive enough but have strong demand, a correction mechanism is designed to enhance their competitiveness at the expense of the other products that are competitive but have no market. The whole process is therefore called collaborative yield learning planning. To evaluate the advantages or disadvantages of the proposed methodology, it has been applied to the data collected from a semiconductor manufacturing factory. Experimental results supported the practicability and usefulness of the proposed collaborative yield learning planning approach.