Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy

Abstract:

Article Preview

We prepared a series of mesoporous silica films to study the structural information of ordered pores by positronium Time of Flight (Ps-TOF) spectroscopy. By changing the ratio of surfactant to silicon source, the pore structure is tuned. Results show that once ordered pores are formed, clear Ps TOF peak is observed. And the film with less distributed pore geometry leads to a narrowed Ps TOF peak.

Info:

Periodical:

Edited by:

S. J. Wang, Z. Q. Chen, B. Wang and Y. C. Jean

Pages:

201-203

DOI:

10.4028/www.scientific.net/MSF.607.201

Citation:

X. B. Qin et al., "Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy", Materials Science Forum, Vol. 607, pp. 201-203, 2009

Online since:

November 2008

Export:

Price:

$35.00

In order to see related information, you need to Login.