Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy
We prepared a series of mesoporous silica films to study the structural information of ordered pores by positronium Time of Flight (Ps-TOF) spectroscopy. By changing the ratio of surfactant to silicon source, the pore structure is tuned. Results show that once ordered pores are formed, clear Ps TOF peak is observed. And the film with less distributed pore geometry leads to a narrowed Ps TOF peak.
S. J. Wang, Z. Q. Chen, B. Wang and Y. C. Jean
X. B. Qin et al., "Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy", Materials Science Forum, Vol. 607, pp. 201-203, 2009