A MEMS Capacitive Gyroscope with Improved Reliability

Abstract:

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The MEMS capacitive gyroscope has wide application foreground, the reliability of MEMS gyroscope is a key problem for its commercial application. With the development of the MEMS gyroscope industrialization, the reliability is underway to meet the need of market. In this paper, the adhesion failure modes of the MEMS gyroscope were presented. In addition, the adhesion failure analysis was illustrated. Finally, a lateral comb structure to improve the reliability of the MEMS gyroscope was presented. Test result indicates that the reliability of the MEMS capacitive gyroscope is improved.

Info:

Periodical:

Materials Science Forum (Volumes 628-629)

Edited by:

Dongming Guo, Jun Wang, Zhenyuan Jia, Renke Kang, Hang Gao, and Xuyue Wang

Pages:

341-346

DOI:

10.4028/www.scientific.net/MSF.628-629.341

Citation:

X. J. Liang and S.Q. Gao, "A MEMS Capacitive Gyroscope with Improved Reliability", Materials Science Forum, Vols. 628-629, pp. 341-346, 2009

Online since:

August 2009

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Price:

$35.00

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