Metallurgical Investigation on Low Ductility Failures of Cu-ETP Components

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Abstract:

In the present paper, the investigation on low ductility failures occurred to ETP copper strips and connectors manufactured from cold stamping of copper tubes is presented. Optical microscopy, SEM/EDS for macro- and microfractography and local elemental analysis along with tensile testing were employed as the principal analytical techniques in the context of the present investigation. Casting defects and microstructural abnormalities associated to hydrogen induced cracking (H.I.C.) are the principal contributors of the examined failures.

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Materials Science Forum (Volumes 638-642)

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3901-3906

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January 2010

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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