Metallurgical Investigation on Low Ductility Failures of Cu-ETP Components
In the present paper, the investigation on low ductility failures occurred to ETP copper strips and connectors manufactured from cold stamping of copper tubes is presented. Optical microscopy, SEM/EDS for macro- and microfractography and local elemental analysis along with tensile testing were employed as the principal analytical techniques in the context of the present investigation. Casting defects and microstructural abnormalities associated to hydrogen induced cracking (H.I.C.) are the principal contributors of the examined failures.
T. Chandra, N. Wanderka, W. Reimers , M. Ionescu
G. Pantazopoulos et al., "Metallurgical Investigation on Low Ductility Failures of Cu-ETP Components", Materials Science Forum, Vols. 638-642, pp. 3901-3906, 2010