Metallurgical Investigation on Low Ductility Failures of Cu-ETP Components

Abstract:

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In the present paper, the investigation on low ductility failures occurred to ETP copper strips and connectors manufactured from cold stamping of copper tubes is presented. Optical microscopy, SEM/EDS for macro- and microfractography and local elemental analysis along with tensile testing were employed as the principal analytical techniques in the context of the present investigation. Casting defects and microstructural abnormalities associated to hydrogen induced cracking (H.I.C.) are the principal contributors of the examined failures.

Info:

Periodical:

Materials Science Forum (Volumes 638-642)

Main Theme:

Edited by:

T. Chandra, N. Wanderka, W. Reimers , M. Ionescu

Pages:

3901-3906

DOI:

10.4028/www.scientific.net/MSF.638-642.3901

Citation:

G. Pantazopoulos et al., "Metallurgical Investigation on Low Ductility Failures of Cu-ETP Components", Materials Science Forum, Vols. 638-642, pp. 3901-3906, 2010

Online since:

January 2010

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$35.00

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