Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

Abstract:

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The present study is dedicated to high energy x-ray diffraction measurements of residual stress at bone-implant interfaces. Bone regeneration is different from soft tissue repair as scar formation never occurs and as de novo bone tissue is produced with proliferation and differentiation of mesenchymal cells. To start the bone remodelling, the stress – the most important mechanical factor – should stimulate the osteocytes. Osseointegration is also observed with non-functional implants, in particular with dental implants. This means that a stress similar to a residual stress must exist.

Info:

Periodical:

Edited by:

Y. Akiniwa, K. Akita and H. Suzuki

Pages:

180-184

DOI:

10.4028/www.scientific.net/MSF.652.180

Citation:

B. Mireux et al., "Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction", Materials Science Forum, Vol. 652, pp. 180-184, 2010

Online since:

May 2010

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Price:

$35.00

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