Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

Bastien Mireux; Thomas Buslaps; Veijo Honkimäki; Alain Lodini; Jean Michel Sprauel

doi:10.4028/www.scientific.net/MSF.652.180

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Non Destructive Characterization of Phase Distribution and Residual Strain/Stress Map of Two Ancient (Koto) Age Japanese Swords
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Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction
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The Robot Concept at STRESS-SPEC for the Characterisation or Semi-Finished Products
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Hybrid Measurement of CT and Strain Distribution of Internal Crack Using Synchrotron High-Energy Monochromatic X-Rays
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HomeMaterials Science ForumMaterials Science Forum Vol. 652Residual Stress Evaluation at Bone Implant...

Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

Abstract:

The present study is dedicated to high energy x-ray diffraction measurements of residual stress at bone-implant interfaces. Bone regeneration is different from soft tissue repair as scar formation never occurs and as de novo bone tissue is produced with proliferation and differentiation of mesenchymal cells. To start the bone remodelling, the stress – the most important mechanical factor – should stimulate the osteocytes. Osseointegration is also observed with non-functional implants, in particular with dental implants. This means that a stress similar to a residual stress must exist.

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Periodical:

Materials Science Forum (Volume 652)

Pages:

180-184

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.652.180

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Online since:

May 2010

Authors:

Bastien Mireux, Thomas Buslaps, Veijo Honkimäki, Alain Lodini, Jean Michel Sprauel

Keywords:

Hydroxyapatite (HAP), Implant, Interface, Stress, Synchrotron, X-Ray

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